Thursday, September 03, 2015

A scanning tunneling microscope break junction method with continuous bias modulation

Nanoscale, 2015, 7,14965-14973
DOI: 10.1039/C5NR04649A, Paper
Edward Beall, Xing Yin, David H. Waldeck, Emil Wierzbinski
A simple STM Break Junction procedure that allows AC current-voltage characterization of molecules with high statistics is presented.
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