Nanoscale, 2015, Advance Article
DOI: 10.1039/C5NR04592D, Paper
DOI: 10.1039/C5NR04592D, Paper
Ya Yi, Changming Wu, Hongchao Liu, Jiali Zeng, Hongtao He, Jiannong Wang
A scanning photocurrent microscopy method is applied to study the lateral expansion of depletion regions at the metal/2D TMDC Schottky contacts with different gate and drain biases.
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A scanning photocurrent microscopy method is applied to study the lateral expansion of depletion regions at the metal/2D TMDC Schottky contacts with different gate and drain biases.
To cite this article before page numbers are assigned, use the DOI form of citation above.
The content of this RSS Feed (c) The Royal Society of Chemistry
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