Nanoscale, 2015, Advance Article
DOI: 10.1039/C5NR04293C, Paper
DOI: 10.1039/C5NR04293C, Paper
Pawan Kumar Srivastava, Subhasis Ghosh
By correlating Raman spectra and electrical measurements, we demonstrate that defect-engineering can be used to estimate various possible scatterers in graphene monolayers on solid substrates.
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By correlating Raman spectra and electrical measurements, we demonstrate that defect-engineering can be used to estimate various possible scatterers in graphene monolayers on solid substrates.
To cite this article before page numbers are assigned, use the DOI form of citation above.
The content of this RSS Feed (c) The Royal Society of Chemistry
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