Mechanisms of Electron-Beam-Induced Damage in Perovskite Thin Films Revealed by Cathodoluminescence Spectroscopy

The Journal of Physical Chemistry C

DOI: 10.1021/acs.jpcc.5b09698

Chuanxiao Xiao, Zhen Li, Harvey Guthrey, John Moseley, Ye Yang, Sarah Wozny, Helio Moutinho, Bobby To, Joseph J. Berry, Brian Gorman, Yanfa Yan, Kai Zhu and Mowafak Al-Jassim
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