Work Function Measurement of Silicon Germanium Heterostructures Combining Kelvin Force Microscopy and X-ray Photoelectron Emission Microscopy

The Journal of Physical Chemistry C

DOI: 10.1021/acs.jpcc.5b09278

Sylvain Pouch, Michele Amato, Matteo Bertocchi, Stefano Ossicini, Nicolas Chevalier, Thierry Mélin, Jean-Michel Hartmann, Olivier Renault, Vincent Delaye, Denis Mariolle and Łukasz Borowik
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