Tuesday, December 01, 2015

Control of Grain Boundary Depletion Layer and Capacitance in ZnO Thin Film by a Gate with Electric Double Layer Dielectric

TOC Graphic

The Journal of Physical Chemistry C
DOI: 10.1021/acs.jpcc.5b08761

Ravindra Singh Bisht, Rishi Ram Ghimire and A. K. Raychaudhuri
Click for full article
Posted by at
Labels: ,

No comments:

Post a Comment

Subscribe to: Post Comments (Atom)