Monday, December 14, 2015

Direct observation of structural and defect evolution in C-rich SiC using in situ helium ion microscopy

Nanoscale, 2016, Advance Article
DOI: 10.1039/C5NR06659J, Communication
Wen Liu, Laifei Cheng, Xiaoqiang Li, Yiguang Wang
The microstructural effects of SiC swelling, mechanisms of He diffusion and aggregation in C-rich SiC are studied using an in situ helium ion microscope.
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