Thursday, December 27, 2012

Raman spectrum method for characterization of pull-in voltages of graphene capacitive shunt switches

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Peng Li, Zheng You, and Tianhong Cui

An approach using Raman spectrum method is reported to measure pull-in voltages of graphene capacitive shunt switches. When the bias excesses the pull-in voltage, the Raman spectrum's intensity largely decreases. Two factors that contribute to the intensity reduction are investigated. Moreover, by ... [Appl. Phys. Lett. 101, 263103 (2012)] published Thu Dec 27, 2012.



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