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Osman El-Atwani, Anastassiya Suslova, and Alexander DeMasi et al.
Real time grazing incidence small angle x-ray scattering and x-ray fluorescence (XRF) are used to elucidate nanodot formation on silicon surfaces during low energy ion beam irradiation of ultrathin iron-coated silicon substrates. Four surface modification stages were identified: (1) surface roughe ... [Appl. Phys. Lett. 101, 263104 (2012)] published Thu Dec 27, 2012.
Link to full article
Osman El-Atwani, Anastassiya Suslova, and Alexander DeMasi et al.
Real time grazing incidence small angle x-ray scattering and x-ray fluorescence (XRF) are used to elucidate nanodot formation on silicon surfaces during low energy ion beam irradiation of ultrathin iron-coated silicon substrates. Four surface modification stages were identified: (1) surface roughe ... [Appl. Phys. Lett. 101, 263104 (2012)] published Thu Dec 27, 2012.
Link to full article
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