Wednesday, January 02, 2013

Atomic-Scale Evidence for Potential Barriers and Strong Carrier Scattering at Graphene Grain Boundaries: A Scanning Tunneling Microscopy Study

Justin C. Koepke, Joshua D. Wood, David Estrada, Zhun-Yong Ong, Kevin T. He, Eric Pop and Joseph W. Lyding



TOC Graphic


ACS Nano

DOI: 10.1021/nn302064p






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