Electro-mechanical coupling of semiconductor film grown on stainless steel by oxidation

M. C. Lin, G. Wang, and L. Q. Guo et al.

Electro-mechanical coupling phenomenon in oxidation film on stainless steel has been discovered by using current-sensing atomic force microscopy, along with the I-V curves measurements. The oxidation films exhibit either ohmic, n-type, or p-type semiconductor properties, according to the obtained ... [Appl. Phys. Lett. 103, 143118 (2013)] published Thu Oct 03, 2013.



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