Thursday, April 24, 2014

Force and conductance molecular break junctions with time series crosscorrelation




Nanoscale , 2014, Advance Article

DOI: 10.1039/C4NR00654B, Communication

Joseph M. Hamill, Kun Wang, Bingqian Xu

A multivariate time series analysis as a toolbox for single molecular junctions is developed. This 2D crosscorrelation method reveals relationships between detailed features of the break junction data which allow the experimentalist to corroborate predictions made by theoretical simulations, allowing both to work in better cooperation and therefore paves the way to the advancement of the field of molecular electronics.

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