Transmission electron microscopy analysis for the process of crystallization of ##IMG## [http://ift.tt/1ihVmZF] {$\text{C}{{\text{u}}_{2}}\text{ZnSn}{{\text{S}}_{4}}$} film from sputtered Zn/CuSn precursor

The mechanism of crystallization of ##IMG## [http://ift.tt/1jUUXZQ] {$\text{C}{{\text{u}}_{2}}\text{ZnSn}{{\text{S}}_{4}}$} (CZTS) made by the sulfurization of a sputtered Zn/CuSn stack was studied by transmission electron microscopy. At ##IMG## [http://ift.tt/1ihVnfT] {$250\;{}^\circ \text{C}$} , the Zn buried at the bottom of the metallic stack was found to be driven to the upper layer by alloying with Cu and reacting with S to form ZnS. At ##IMG## [http://ift.tt/1ihVnfV] {$500\;{}^\circ \text{C}$} , CZTS was found to be formed and elemental Sn was observed in the vicinity of the back contact region, while large quantities of ##IMG## [http://ift.tt/1jUUZAL] {$\text{C}{{\text{u}}_{2}}\text{S}$} and ZnS were segregated at the ...

Wei Li, Jian Chen, Chang Yan, Fangyang Liu and Xiaojing Hao

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