Nanoscale , 2014, Advance Article
DOI: 10.1039/C4NR00632A, Paper
DOI: 10.1039/C4NR00632A, Paper
Andrea Cavallaro, George F. Harrington, Stephen J. Skinner, John A. Kilner
Low Energy Ion Scattering (LEIS) has been employed to optimize a thermal treatment to achieve a fully A-terminated NdGaO3 (110) single crystal surface. In the image, a NdGaO3 single crystal as-received has been analyzed by TEM. The LEIS depth profile analysis (superimposed) has identified a different Nd and Ga stoichiometry in the first 20nm surface with respect to the crystal bulk, corresponding to an amorphous layer observed in the TEM image.
To cite this article before page numbers are assigned, use the DOI form of citation above.
The content of this RSS Feed (c) The Royal Society of Chemistry
Low Energy Ion Scattering (LEIS) has been employed to optimize a thermal treatment to achieve a fully A-terminated NdGaO3 (110) single crystal surface. In the image, a NdGaO3 single crystal as-received has been analyzed by TEM. The LEIS depth profile analysis (superimposed) has identified a different Nd and Ga stoichiometry in the first 20nm surface with respect to the crystal bulk, corresponding to an amorphous layer observed in the TEM image.
To cite this article before page numbers are assigned, use the DOI form of citation above.
The content of this RSS Feed (c) The Royal Society of Chemistry
Click for full article
No comments:
Post a Comment