Monday, May 12, 2014

Using Metallic Noncontact Atomic Force Microscope Tips for Imaging Insulators and Polar Molecules: Tip Characterization and Imaging Mechanisms

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ACS Nano

DOI: 10.1021/nn501785q




David Zhe Gao, Josef Grenz, Matthew Benjamin Watkins, Filippo Federici Canova, Alexander Schwarz, Roland Wiesendanger and Alexander L. Shluger

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