Friday, March 27, 2015

Investigation of Line Width Narrowing and Spectral Jumps of Single Stable Defect Centers in ZnO at Cryogenic Temperature

TOC Graphic


Nano Letters

DOI: 10.1021/nl504941q




Oliver Neitzke, Anthony Morfa, Janik Wolters, Andreas W. Schell, Günter Kewes and Oliver Benson

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