Tuesday, January 19, 2016

Understanding properties of engineered catalyst supports using contact angle measurements and X-Ray reflectivity

Nanoscale, 2016, Advance Article
DOI: 10.1039/C5NR08108D, Paper
Placidus B. Amama, Ahmad E. Islam, Sammy M. Saber, Daniel R. Huffman, Benji Maruyama
Using a combination of contact angle measurements and X-ray reflectivity, new correlations between the physicochemical properties of pristine and engineered catalyst substrates and carbon nanotube growth behavior have been established. This study advances the use of a non-thermochemical approach for catalyst substrate engineering.
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