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G. E. Ghezzi, R. Morel, and A. Brenac et al.
The crystallization behavior of Ge2Sb2Te5 nanometric clusters was studied using X-ray diffraction with in situ annealing. Clusters were made using a sputtering gas-phase condensation source, which allowed for the growth of well-defined, contaminant-free, and isolated clusters. The average size for ... [Appl. Phys. Lett. 101, 233113 (2012)] published Thu Dec 06, 2012.
Link to full article
G. E. Ghezzi, R. Morel, and A. Brenac et al.
The crystallization behavior of Ge2Sb2Te5 nanometric clusters was studied using X-ray diffraction with in situ annealing. Clusters were made using a sputtering gas-phase condensation source, which allowed for the growth of well-defined, contaminant-free, and isolated clusters. The average size for ... [Appl. Phys. Lett. 101, 233113 (2012)] published Thu Dec 06, 2012.
Link to full article
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