Kun Xu, Caifu Zeng, Qin Zhang, Rusen Yan, Peide Ye, Kang Wang, Alan C. Seabaugh, Huili Grace Xing, John S. Suehle, Curt A. Richter, David J. Gundlach and N. V. Nguyen

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Nano Letters
DOI: 10.1021/nl303669w
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