FluidFM as lithography tool in liquid: Spatially controlled deposition of fluorescent nanoparticles

Tomaso Zambelli

Nanoscale , 2012, Accepted Manuscript

DOI: 10.1039/C2NR33214K, Paper

Raphael R. Gruter, Janos Voros, Tomaso Zambelli

Atomic force microscope (AFM) is a powerful instrument for nanolithography, which is well characterized in air where the deposition process is steered by capillary action. On the contrary, AFM patterning...

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