Spatial Modeling for Refining and Predicting Surface Potential Mapping with Enhanced Resolution

Xudong Wang

, 2012, Accepted Manuscript

DOI: 10.1039/C2NR33603K, Communication

Qiong Zhang, Xinwei Deng, Peter Z.G. Qian, Xudong Wang

Quantitatively mapping surface properties with nanometer or even subnanometer resolutions is critical for advanced scanning probe microscopy (SPM) characterization. However, the characterization performance is often suffered from noises and artifacts...

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