Tip loading effects on AFM-based transport measurements of metal–oxide interfaces

Here we demonstrate the effects of tip loading force on the contact quality and local current–voltage character between conductive AFM tips and individual noble metal nanoparticle–strontium titanate (NP–STO) interfaces. These results show that though contact quality may improve with increased loading force, nanoparticle deformation remains negligible for loading forces in the nN–μN range. Maintaining a moderate loading force in the tens to hundreds of nN therefore enables size-dependent transport of individual NP–STO interfaces to be determined.

Jiechang Hou, Baptiste Rouxel, Wei Qin, Stephen S Nonnenmann and Dawn A Bonnell

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