Friday, May 09, 2014

Impedance spectroscopic analysis on effects of partial oxidation of TiN bottom electrode and microstructure of amorphous and crystalline HfO2 thin films on their bipolar resistive switching




Nanoscale , 2014, Advance Article

DOI: 10.1039/C4NR00507D, Paper

Ji-Wook Yoon, Jung Ho Yoon, Jong-Heun Lee, Cheol Seong Hwang

Microscopic-level changes such as the dynamic evolutions in conducting filament, interfacial TiON region, and matrix phase during various steps of resistance switching were studied using AC impedance spectroscopy.

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