Nanoscale, 2015, 7,11393-11400
DOI: 10.1039/C5NR02219C, Paper
DOI: 10.1039/C5NR02219C, Paper
Lin Gan, Fang-Fang Xu, Xiong-Hui Zeng, Zuo-Sheng Li, Zhi-Yong Mao, Ping Lu, Ying-Chun Zhu, Xue-Jian Liu, Lin-Lin Zhang
Atom-resolved Cs-corrected scanning transmission electron microscopy has determined the location of doped Ce atoms in the [small beta]-SiAlON lattice. It was found that there are three different occupation sites.
The content of this RSS Feed (c) The Royal Society of Chemistry
Atom-resolved Cs-corrected scanning transmission electron microscopy has determined the location of doped Ce atoms in the [small beta]-SiAlON lattice. It was found that there are three different occupation sites.
The content of this RSS Feed (c) The Royal Society of Chemistry
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