Wednesday, May 20, 2015

Al- and Ga-Doped TiO2, ZrO2, and HfO2: The Nature of O 2p Trapped Holes from a Combined Electron Paramagnetic Resonance (EPR) and Density Functional Theory (DFT) Study

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Chemistry of Materials
DOI: 10.1021/acs.chemmater.5b00800

Chiara Gionco, Stefano Livraghi, Sara Maurelli, Elio Giamello, Sergio Tosoni, Cristiana Di Valentin and Gianfranco Pacchioni
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