Friday, May 29, 2015

Few layer MoS2 lithography with AFM tip: description of the technique and nanospectroscopy investigation

Nanoscale, 2015, Accepted Manuscript
DOI: 10.1039/C5NR02337H, Paper
Maurizio Donarelli, Francesco Perrozzi, Federico Bisti, Francesco Paparella, Vitaliy Feyer, Andrea Ponzoni, Munkhsaikhan Gonchigsuren, L. Ottaviano
A novel technique to lithograph MoS2 surface is here described. Mechanically exfoliated MoS2 flakes have been patterned with an atomic force microscope tip. After the patterning process, the lithographed areas...
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