Thursday, May 28, 2015

Measuring Graphene Adhesion using Atomic Force Microscopy with a Microsphere Tip

Nanoscale, 2015, Accepted Manuscript
DOI: 10.1039/C5NR02480C, Paper
Tao Jiang, Yong Zhu
Van der Waals adhesion between graphene and various substrates has an important impact on the physical properties, device applications and nanomanufacturing processes of graphene. Here we report a general, high-throughput...
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