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Ruiwen Shao, Kun Zheng, and Yuefei Zhang et al.
In situ electrical measurement experiments were carried out in individual SiC nanowires (NWs) subjected to tensile strain using a transmission electron microscope. Fracture strain approaching 10% was achieved for a diamond-structure SiC NW with a 〈111〉 direction. With an increase in the tensile st ... [Appl. Phys. Lett. 101, 233109 (2012)] published Wed Dec 05, 2012.
Link to full article
Ruiwen Shao, Kun Zheng, and Yuefei Zhang et al.
In situ electrical measurement experiments were carried out in individual SiC nanowires (NWs) subjected to tensile strain using a transmission electron microscope. Fracture strain approaching 10% was achieved for a diamond-structure SiC NW with a 〈111〉 direction. With an increase in the tensile st ... [Appl. Phys. Lett. 101, 233109 (2012)] published Wed Dec 05, 2012.
Link to full article
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