Wednesday, December 05, 2012

The c-axis thermal conductivity of graphite film of nanometer thickness measured by time resolved X-ray diffraction

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M. Harb, C. von Korff Schmising, and H. Enquist et al.

We report on the use of time resolved X-ray diffraction to measure the dynamics of strain in laser-excited graphite film of nanometer thickness, obtained by chemical vapour deposition (CVD). Heat transport in the CVD film is simulated with a 1-dimensional heat diffusion model. We find the experime ... [Appl. Phys. Lett. 101, 233108 (2012)] published Wed Dec 05, 2012.



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