Thursday, March 28, 2013

Far-field free tapping-mode tip-enhanced Raman microscopy

(author unknown)



Jun Yu, Yuika Saito, and Taro Ichimura et al.

A tip-enhanced Raman scattering (TERS) microscope has been developed, which is based on the tapping-mode operation of atomic force microscopy. By synchronizing a multichannel detector with tapping oscillation of the metallic nanotip, one can measure a tip-sample separation dependent TERS spectrum ... [Appl. Phys. Lett. 102, 123110 (2013)] published Thu Mar 28, 2013.



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