Thursday, July 25, 2013

Non-destructive and rapid evaluation of chemical vapor deposition graphene by dark field optical microscopy

X. H. Kong, H. X. Ji, and R. D. Piner et al.

Non-destructive and rapid evaluation of graphene directly on the growth substrate (Cu foils) by dark field (DF) optical microscopy is demonstrated. Without any additional treatment, graphene on Cu foils with various coverages can be quickly identified by DF imaging immediately after chemical vapor ... [Appl. Phys. Lett. 103, 043119 (2013)] published Thu Jul 25, 2013.



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