Wednesday, July 03, 2013

Simultaneous imaging of surface and magnetic forces

Daniel Forchheimer, Daniel Platz, and Erik A. Tholén et al.

We demonstrate quantitative force imaging of long-range magnetic forces simultaneously with near-surface van-der-Waals and contact-mechanics forces using intermodulation atomic force microscopy. Magnetic forces at the 200 pN level are separated from near-surface forces at the 30 nN level. Imaging ... [Appl. Phys. Lett. 103, 013114 (2013)] published Wed Jul 03, 2013.



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