Current–Voltage Characterization of Individual As-Grown Nanowires Using a Scanning Tunneling Microscope

Nano Letters

DOI: 10.1021/nl402570u

Rainer Timm, Olof Persson, David L. J. Engberg, Alexander Fian, James L. Webb, Jesper Wallentin, Andreas Jönsson, Magnus T. Borgström, Lars Samuelson and Anders Mikkelsen

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