Nanoscale , 2013, Accepted Manuscript
DOI: 10.1039/C3NR03911K, Paper
DOI: 10.1039/C3NR03911K, Paper
Sen Mei, Longbing He, Xing Wu, Jun Sun, Binjie Wang, Xiaochuan Xiong, Litao Sun
Interface atom migration and compositional evolution during heterostructure nanojoining process under external electrical loadings have been investigated in-situ inside a transmission electron microscope with atomic resolution. The results indicate that...
The content of this RSS Feed (c) The Royal Society of Chemistry
Interface atom migration and compositional evolution during heterostructure nanojoining process under external electrical loadings have been investigated in-situ inside a transmission electron microscope with atomic resolution. The results indicate that...
The content of this RSS Feed (c) The Royal Society of Chemistry
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