Monday, November 03, 2014

High-resolution characterization of the diffusion of light chemical elements in metallic components by scanning microwave microscopy




Nanoscale , 2014, Advance Article

DOI: 10.1039/C4NR04017A, Paper

Virgil Optasanu, Eric Bourillot, Pauline Vitry, Cedric Plassard, Laure Beaurenaut, Pierre Jacquinot, Frederic Herbst, Pascal Berger, Eric Lesniewska, Tony Montessin

An original sub-surface, high spatial resolution tomographic technique based on scanning microwave microscopy (SMM) is used to visualize in-depth materials with different chemical compositions.

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