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Yue Shen, Shouwu Guo, and Jun Hu et al.
We report on the charging of individual graphene oxide (GO) sheets with varied degrees of reduction by using electrically biased atomic force microscope (AFM) tips. AFM measurements indicate that the apparent height of reduced GO (rGO) sheets increases sharply after charging, while the charging ab ... [Appl. Phys. Lett. 101, 183109 (2012)] published Fri Nov 02, 2012.
Link to full article
Yue Shen, Shouwu Guo, and Jun Hu et al.
We report on the charging of individual graphene oxide (GO) sheets with varied degrees of reduction by using electrically biased atomic force microscope (AFM) tips. AFM measurements indicate that the apparent height of reduced GO (rGO) sheets increases sharply after charging, while the charging ab ... [Appl. Phys. Lett. 101, 183109 (2012)] published Fri Nov 02, 2012.
Link to full article
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