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N. R. Lugg, M. Haruta, and M. J. Neish et al.
Electron energy-loss spectroscopy (EELS) studies in scanning transmission electron microscopy are widely used to investigate the location and bonding of atoms in condensed matter. However, the interpretation of EELS data is complicated by multiple elastic and thermal diffuse scattering of the prob ... [Appl. Phys. Lett. 101, 183112 (2012)] published Fri Nov 02, 2012.
Link to full article
N. R. Lugg, M. Haruta, and M. J. Neish et al.
Electron energy-loss spectroscopy (EELS) studies in scanning transmission electron microscopy are widely used to investigate the location and bonding of atoms in condensed matter. However, the interpretation of EELS data is complicated by multiple elastic and thermal diffuse scattering of the prob ... [Appl. Phys. Lett. 101, 183112 (2012)] published Fri Nov 02, 2012.
Link to full article
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