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A. Lupascu, Renfei Feng, and L. J. Sandilands et al.
We demonstrate that structural and spectroscopic information can be obtained on exfoliated nanocrystals as thin as 6 nm. This can be achieved by using a combination of micro X-ray fluorescence (μXRF), micro X-ray absorption near-edge spectroscopy (μXANES), and X-ray microdiffraction (μXRD) techniq ... [Appl. Phys. Lett. 101, 223106 (2012)] published Mon Nov 26, 2012.
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A. Lupascu, Renfei Feng, and L. J. Sandilands et al.
We demonstrate that structural and spectroscopic information can be obtained on exfoliated nanocrystals as thin as 6 nm. This can be achieved by using a combination of micro X-ray fluorescence (μXRF), micro X-ray absorption near-edge spectroscopy (μXANES), and X-ray microdiffraction (μXRD) techniq ... [Appl. Phys. Lett. 101, 223106 (2012)] published Mon Nov 26, 2012.
Link to full article
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