A Novel Approach for Measuring the Intrinsic Nanoscale Thickness of Polymer Brushes by means of Atomic Force Microscopy:Application of a Compressible Fluid Model

Nanoscale , 2013, Accepted Manuscript

DOI: 10.1039/C3NR02929H, Paper

Sergio Enrique Moya, Irantzu Llarena, Edwin Donath, Jagoba Iturri, Jose Luis Cuellar

The thickness of a poly (sulfo propyl methacrylate) (PSPM) brush is determined by Atomic Force Microscopy (AFM) imaging as function of the loading force at different ionic strengths, ranging from...

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