Tuesday, September 24, 2013

Defect-Driven Radioluminescence Sensitization in Scintillators: The Case of Lu2Si2O7:Pr

TOC Graphic


The Journal of Physical Chemistry C

DOI: 10.1021/jp407248q




Elisa Dell’Orto, Mauro Fasoli, Guohao Ren and Anna Vedda

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