Nanoscale , 2013, Advance Article
DOI: 10.1039/C3NR03338D, Feature Article
DOI: 10.1039/C3NR03338D, Feature Article
Karim Gadelrab, Sergio Santos, Josep Font, Matteo Chiesa
The monitoring of the deflection of a micro-cantilever as the end of a sharp probe mounted at its end, i.e. the tip, interacts with a surface forms the foundation of atomic force microscopy AFM.
To cite this article before page numbers are assigned, use the DOI form of citation above.
The content of this RSS Feed (c) The Royal Society of Chemistry
The monitoring of the deflection of a micro-cantilever as the end of a sharp probe mounted at its end, i.e. the tip, interacts with a surface forms the foundation of atomic force microscopy AFM.
To cite this article before page numbers are assigned, use the DOI form of citation above.
The content of this RSS Feed (c) The Royal Society of Chemistry
Click for full article
No comments:
Post a Comment