Strengthening Brittle Semiconductor Nanowires through Stacking Faults: Insights from in Situ Mechanical Testing

Nano Letters

DOI: 10.1021/nl402180k

Bin Chen, Jun Wang, Qiang Gao, Yujie Chen, Xiaozhou Liao, Chunsheng Lu, Hark Hoe Tan, Yiu-Wing Mai, Jin Zou, Simon P. Ringer, Huajian Gao and Chennupati Jagadish

Click for full article