In situ TEM analysis of resistive switching in manganite based thin-film heterostructures

Nanoscale , 2014, Accepted Manuscript

DOI: 10.1039/C4NR02020K, Paper

Jonas Norpoth, Stephanie Mildner, Malte Scherff, Jorg Hoffmann, Christian Jooss

The mechanism of the electric-pulse induced resistance change effect in Au/Pr_0.65 Ca_0.35 MnO₃ /SrTi_0.99 Nb_0.01 O₃ thin-film devices is studied by means of in situ electrical stimulation inside a transmission electron microscope. A detailed equivalent-circuit...

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