Friday, May 22, 2015

Increased localization precision by interference fringe analysis

Nanoscale, 2015, Advance Article
DOI: 10.1039/C5NR01927C, Paper
Carl G. Ebeling, Amihai Meiri, Jason Martineau, Zeev Zalevsky, Jordan M. Gerton, Rajesh Menon
Localization precision of nanoparticles is increased by analyzing the interference pattern of a Fourier domain signal.
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