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Jun Hyun Han, Kyung Song, and Shankar Radhakrishnan et al.
A sub-nanometer scale suspended gap (nanogap) defined by electric field-induced atomically sharp metallic tips is presented. A strong local electric field (>109 V/m) across micro/nanomachined tips facing each other causes the metal ion migration in the form of dendrite-like growth at the cathode. ... [Appl. Phys. Lett. 101, 183106 (2012)] published Fri Nov 02, 2012.
Link to full article
Jun Hyun Han, Kyung Song, and Shankar Radhakrishnan et al.
A sub-nanometer scale suspended gap (nanogap) defined by electric field-induced atomically sharp metallic tips is presented. A strong local electric field (>109 V/m) across micro/nanomachined tips facing each other causes the metal ion migration in the form of dendrite-like growth at the cathode. ... [Appl. Phys. Lett. 101, 183106 (2012)] published Fri Nov 02, 2012.
Link to full article
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