Nanoscale , 2013, Advance Article
DOI: 10.1039/C3NR03306F, Paper
DOI: 10.1039/C3NR03306F, Paper
Jie Xu, Jun Xu, Pengzhan Zhang, Wei Li, Kunji Chen
Charge injection and transportation in silicon nanocrystals are characterized by joint analysis of KPFM and CAFM quantitatively at the nanoscale.
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Charge injection and transportation in silicon nanocrystals are characterized by joint analysis of KPFM and CAFM quantitatively at the nanoscale.
To cite this article before page numbers are assigned, use the DOI form of citation above.
The content of this RSS Feed (c) The Royal Society of Chemistry
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