Friday, August 30, 2013

Nanoscale quantification of charge injection and transportation process in Si-nanocrystal based sandwiched structure




Nanoscale , 2013, Advance Article

DOI: 10.1039/C3NR03306F, Paper

Jie Xu, Jun Xu, Pengzhan Zhang, Wei Li, Kunji Chen

Charge injection and transportation in silicon nanocrystals are characterized by joint analysis of KPFM and CAFM quantitatively at the nanoscale.

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