Thursday, August 29, 2013

Single cycle and transient force measurements in dynamic atomic force microscopy

Nanoscale , 2013, Accepted Manuscript

DOI: 10.1039/C3NR03338D, Feature Article

Karim R. Gadelrab, Sergio Santos, Josep Font, Matteo Chiesa

The monitoring of the deflection of a micro-cantilever as the end of a sharp probe mounted at its end, i.e. the tip, interacts with a surface forms the foundation of...

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