Tuesday, September 10, 2013

Li Segregation Induces Structure and Strength Changes at the Amorphous Si/Cu Interface

TOC Graphic


Nano Letters

DOI: 10.1021/nl402353k




Maria E. Stournara, Xingcheng Xiao, Yue Qi, Priya Johari, Peng Lu, Brian W. Sheldon, Huajian Gao and Vivek B. Shenoy

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