Wednesday, May 29, 2013

Direct Atom-by-Atom Chemical Identification of Nanostructures and Defects of Topological Insulators

Ying Jiang, Yong Wang, Jared Sagendorf, Damien West, Xufeng Kou, Xiao Wei, Liang He, Kang L. Wang, Shengbai Zhang and Ze Zhang



TOC Graphic


Nano Letters

DOI: 10.1021/nl401186d






Link to full article
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