Friday, May 31, 2013

High speed atomic force microscopy enabled by a sample profile estimator

(author unknown)



Peng Huang and Sean B. Andersson

In this paper, an estimation scheme for imaging in Atomic Force Microscopy (AFM) is presented which yields imaging rates well beyond the bandwidth of the vertical positioner and allows for high-speed AFM on a typical commercial instrument. The estimator can be applied to existing instruments with ... [Appl. Phys. Lett. 102, 213118 (2013)] published Fri May 31, 2013.



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