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Peng Huang and Sean B. Andersson
In this paper, an estimation scheme for imaging in Atomic Force Microscopy (AFM) is presented which yields imaging rates well beyond the bandwidth of the vertical positioner and allows for high-speed AFM on a typical commercial instrument. The estimator can be applied to existing instruments with ... [Appl. Phys. Lett. 102, 213118 (2013)] published Fri May 31, 2013.
Link to full article
Peng Huang and Sean B. Andersson
In this paper, an estimation scheme for imaging in Atomic Force Microscopy (AFM) is presented which yields imaging rates well beyond the bandwidth of the vertical positioner and allows for high-speed AFM on a typical commercial instrument. The estimator can be applied to existing instruments with ... [Appl. Phys. Lett. 102, 213118 (2013)] published Fri May 31, 2013.
Link to full article
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